• Your invitation to the workshop experience

• Major Technical Themes

Defect Generation and Reliability of Ultra-thin SiO₂ at Low Voltages

* * Group Discussions

• WLR monitoring

• Ultra-Thin Oxides

• Electromigration

• Burn-In

• NBTI

* * Tutorials

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• Managing Technology Qualification in a Foundry/Fabless Partnership

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• Integrated Circuit Fabrication Technology and Yield Control

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• Ultra-Thin Gate Oxide Reliability for ULSI Applications

* * 25+ Technical Presentations on:

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• Session #1: Designing-In Reliability (DIR)

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• Session #2 Customer Product Reliability Requirements (CPR)

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• Session #3 Contributors to Failure (CTF)

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• Session #4: Reliability Characterisation & Models (RCM)

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• Session #5 Wafer Level Reliability (WLR)

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• Session #6: Contributors to Failure (CTF)

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• Session #7: Contributors to Failure (CTF)

* * Refereed & Open Poster Sessions

* * Special Interest Groups

• Tahoe Casino Express

• More Info

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