NBTI DISCUSSION GROUP SURVEY
Name (optional):
Company (optional):
Please rank the topics below in order of importance to you and your organization.
(1 = not important, 2 = neutral, 3 = very important)
|
Topics |
Rating |
||
|
Vt Power-law time slope discrepancies |
1 |
2 |
3 |
|
NBTI recovery and frequency dependence |
1 |
2 |
3 |
|
Impact of nitridation |
1 |
2 |
3 |
|
Models for NBTI: charge trapping, fixed charge creation, interface states |
1 |
2 |
3 |
|
What are the precursors/defects? |
1 |
2 |
3 |
|
New aspects of NBTI that were presented at the 2005 IRW. |
1 |
2 |
3 |
|
Back end processes that affect NBTI |
1 |
2 |
3 |
|
NBTI relationship with Hot Carrier (HC) and Time-Dependent Dielectric Breakdown (TDDB) instabilities |
1 |
2 |
3 |
|
NBTI kinetics: time, temperature and field dependencies |
1 |
2 |
3 |
|
How to meaningfully measure NBTI: choice of device, parameter, and lifetime criterion |
1 |
2 |
3 |