Presenter: Sammy Kayali
Title: Microelectronics for Space Applications - Challenges and Opportunities
Organization: Jet Propulsion Laboratory, California Institute of Technology
New space system implementations require the use of advanced microelectronic devices in critical applications. System demands such as increases in functionality and reduction of mass, power and volume make the need for such advanced microelectronic devices more pressing. However, newly developed advanced microelectronic devices lack the traditional reliability and characterization data necessary for qualification for insertion into space systems.
The growth and maturity of the semiconductor industry has resulted in substantial improvements in processing methods, fabrication yield, and overall quality of commercially viable semiconductor devices. This coupled with large volume production and the utilization of statistical process control has greatly reduced the infant mortality population across the industry. However, reproducibility of a product does not guarantee reliability in the intended application. For critical space applications where the success or failure of a mission hinges on the lifetime and performance of a single device; it is critical that all aspects of the reliability and the various known failure modes and mechanisms be addressed prior to the insertion of the component in the application.
The selection and application of microelectronic components in high reliability space systems requires knowledge of the component design, fabrication process, and applicable tests. In addition, reliability analysis and detailed knowledge of the application environment is necessary in order to determine the suitability of the selected component for the application. These issues are of particular importance for the application of semiconductor devices in high reliability systems due to the need for the utilization of large numbers of these devices at the upper limit of their performance and stress capabilities.
In order to collect the reliability and characterization data required for space qualification, an in-depth understanding of the material characteristics, fabrication processes, and relevant failure mechanisms of the technology is necessary. This presentation will provide a description of some of the technical and programmatic challenges affecting the insertion of advanced microelectronics in NASA/JPL flight applications and the methodology necessary to ensure the desired reliability.
Biography:
Sammy Kayali is the Mission Assurance Manager for the Juno Project at the Jet Propulsion Laboratory, California Institute of Technology. His specialty is in the area of compound semiconductor device reliability where he has over 30 publications, two patents pending, and a published book on the subject of GaAs MMIC Reliability. He has served as the chair of the Government Microcircuit Applications & Critical Technology Conference (GOMACTech), the International Reliability Physics Symposium's (IRPS) Compound Semiconductor Session, is a member of the GaAs Reliability Workshop Technical Program Committee, and has participated and chaired a number of various other industry working groups and workshops. He is the recipient of a number of honors and awards including the NASA Exceptional Service Medal. He holds degrees from Texas A&M University and Sam Houston State University in Solid State Physics and Electrical Engineering.