IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP
October 18-22, 2009

 

About IIRW

LODGING & FACILITIES

Nestled throughout the pines and cedars along the shoreline of Fallen Leaf Lake, a few miles from South Lake Tahoe, are clusters of 2 and 3 bedroom cabins furnished in the rustic style of  an alpine resort. Each cabin is equipped with shared bathroom facilities. All rooms have decks with magnificent views of Fallen Leaf Lake and the surrounding Sierra peaks.

The physical isolation of the location and the absence of distractions, such as in-room phones and television sets, encourage extensive interaction among the Workshop attendees.

 

Lodging can only be provided to registered attendees of IIRW.  In accordance with housing rules, no guests of the attendees are allowed.

HISTORY

The IIRW originated from the Wafer Level Reliability Workshop, which was initiated in 1982 through the efforts of O. D. “Bud” Trapp, of Technology Associates, and the financial support of DARPA (Defense Advanced Research Projects Agency) to foster the approach of introducing reliability characterizations at the wafer level.  Also involved were The Stanford University Integrated Circuits Laboratory and the University of California, Berkley, Dept. of Electrical Engineering and Computer Sciences.  Financial support by DARPA continued for the first eight years of the workshop.  Bud Trapp was able to continue the operation of the workshop only until early 1992 when he asked Harry Schafft (then the new Chair of the IRPS Board of Directors) to assume responsibility for the workshop.  With fellow IRPS Board member Pat Kennedy to lead the arrangements and operation of the workshop, a Technical Advisory Committee to represent the interests of the reliability community, and the oversight of IRPS, the workshop was transformed, within two years, into a self-sustaining technical meeting with IEEE sponsorship. In 1993, the name of the workshop was changed to the Integrated Reliability Workshop to reflect the importance of integrating the approach of building-in reliability in the design, processing, and manufacture of semiconductor products.

 

SPONSORS

The International Integrated Reliability Workshop is sponsored and by the IEEE Electron Device Society and the IEEE Reliability Society, and in doing so the IIRW Proceedings (Final Reports) are IEEE published,  archived, and available on IEEE Xplore.