IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP
October 18-22, 2009

 

Tutorials IIRW 2009

IRW Tutorial Co-Chairs:     Andreas Martin, Infineon Technologies AG
                                                       (
andreas.martin@infineon.com)

                                            John Suehle, NIST

                                                   (john.suehle@nist.gov)

 Text Box: The IRW 2009 workshop program will include the following tutorials which are listed in the table below. This list will be updated on a frequent basis. Please click on the hyperlink in the first column and a short abstract of the tutorial and a biography of the presenter will be displayed.

A feedback on the tutorial topics to the Tutorial Chairs is welcome.

 

 

 

 

                

    Status: 2009 September 18th 

Text Box: 2009 Tutorial Program

tutorial topic

tutorial speaker

affiliation

DNA Nanostructures

William B. Knowlton

Boise State University, Boise, ID USA

AFM

Montserrat Nafria Marc Porti

Universitat Autònoma de Barcelona,
Bellaterra, Spain

3D integration and reliability

Alan Mathewson

Tyndall National Institute,
Cork, Republic of Ireland

international fWLR Monitoring guideline

Andreas Aal
Andreas Martin

ELMOS, Dortmund, Germany
Infineon, Munich, Germany

reliability of metallisation

Oliver Aubel

GlobalFoundries (former AMD), Dresden, Germany

ESD

Charvaka Duvvury

Texas Instruments, Austin, TX USA

high-k dielectric / metal gate reliability

Andreas Kerber

GlobalFoundries (former AMD),
Yorktown Heights, NY USA

NBTI

Jason Campbell

National Institute of Standards and Technology, Gaithersburg, MD USA