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IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP
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held October 16-20, 2011 |
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IIRW 2011 Discussion Groups — TBD
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If you desire to discuss a certain topic, contact DG/SIG Chair: James (Jim) Lloyd, SUNY Albany, jlloyd@uamail.albany.edu, especially if you would be willing to volunteer to moderate the discussion of that topic. If we do not have enough people interested in a newly proposed topic it is still possible to form a special interest group (SIG – see SIG page). |
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Topics for IIRW 2010 were: High-k , NBTI, BEOL product reliability, & fast wafer level reliability monitoring. Also in 2010 there was a SIG on fWLR monitoring.
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