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IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP
Tutorials IIRW 2011 |
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IRW Tutorial Co-Chairs:
The 2011 workshop list of six tutorials is as follows:. — Tim Turner (SUNY College of Nanoscale Science and Engineering, Albany, NY): “Reliability assurance and process control for products walking at the edge of the abyss”
— Robert Baumann (Texas Instruments): “Ghosts in the machine – how subatomic-scale events impact us and what we can do about it” — S. Lombardo (CNR-IMM): “New Architectures for Non Volatile Semiconductor Memory Scaling and related reliability issues” — Daniel Bauza (IMEP-LAHC): Charge pumping: an overview of the technique and recent new features — Ryoichi Ishihara (TU-Delft): “Reliability of Poly-Si TFTs and metal-oxide-semiconductor TFTs” — Mark Kuball (University of Bristol): “New Methodologies for Reliability Testing and Analysis: GaN Electronic Devices - Beyond Arrhenius” Feedback on the tutorial topics to the Tutorial Chairs is welcome.
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Status: 2011 Oct. 7th |
