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1999 IRW FEATURES
- • Your invitation to the workshop experience
- • Major Technical Themes
* * Keynote:
Semiconductor System Design
- Influencing Factors for
consideration of Future
Generation System Design
* * Group Discussions
- • Fast WLR monitoring
- • Burn In
- • Thin Oxide Limits
- • Electromigration
- • Hot-Carriers
* * Tutorials
- • Basic Reliability
- • Hot-Carriers
* * 24+ Technical Presentations on:
- • Customer Product Reliability
Requirements
- • Reliability Test Structures
- • Reliability Models * session A / * session B
- • Identification of Reliability
Effects
- • Wafer Level Reliability
* * Open Poster Sessions
* * Special Interest Groups
• What you need to know
• Tahoe Casino Express
• JEDEC 14.2
• More Info
- Register
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