HISTORY

The Wafer Level Reliability Workshop was initiated in 1982 through the efforts of O. D. "Bud" Trapp, of Technology Associates, and the active support and encouragement of DARPA (Defense Advanced Research Projects Agency). This support continued for the first eight years of the Workshop and included active support and involvement of the Stanford University Integrated Circuits Laboratory and the University of California, Berkeley, Dept. of Electrical Engineering and Computer Sciences. After DARPA sponsorship ended, Bud Trapp continued the direction of the Workshop until 1991 after which time he requested that sponsorship and management be assumed by an appropriate professional association. The IEEE accepted this responsibility in 1992. In 1993, the name of the Workshop was changed to the Integrated Reliability Workshop. This change reflects the enlarged scope of the Workshop, the integrated nature of reliability in the manufacture of semiconductor products, and the need for a broader and a more comprehensive approach to reliability engineering.