Will Reliability Limit Moore's Law?
Moore’s law continues to be the engine of growth for the global electronics industry. The understanding of IC degradation mechanisms has resulted in rapid reliability improvements that have enabled the rapid rate technology progression we have experienced. Going forward it is clear that the reliability margins the industry has enjoyed in the past will shrink. The question is now whether reliability will pose a constraint on Moore’s law. In this talk (visuals) we will discuss reliability issues that can most directly impact the industry’s capability to maintain the pace of technology progression required by Moore’s law.
Tony Oates received his B.Sc. and PhD degrees in physics from the University of Reading, U.K, in 1982 and 1985 respectively. He is presently responsible for reliability physics development at TSMC. Prior to joining TSMC in 2002, Dr. Oates spent 17 years as a distinguished member of technical staff and technical manager at Bell Labs and Agere Systems, where he was responsible for reliability characterization and process qualification of CMOS technologies. Dr. Oates has over 100 publications, and holds 5 patents. He is a frequent conference speaker and tutorial presenter. Dr. Oates has a long-standing involvement with the International Reliability Physics Symposium, serving as the General Chair of the Symposium in 2001. He has participated in the technical leadership of the International Electron Device Meeting (IEDM) and Materials Research Society (MRS) Meetings. He is currently Editor-in-Chief of the IEEE Transactions on Device and Materials Reliability (TDMR) and Fellow of the IEEE.