rev 16Sep04 pdf
aka Wafer Level Reliability Workshop
The Integrated Reliability Workshop focuses on ensuring semiconductor reliability through component fabrication, design, characterization, and analysis tools. It provides a unique environment for envisioning, developing, and sharing reliability technology for present and future semiconductor applications. Hot reliability topics of the workshop are: Cu-interconnects & low-k dielectrics, reliability of deep sub-micron, high speed, high frequency devices (e.g. SiGe), SOI devices, reliability modeling & simulation, and the reliability of future technologies such as molecular electronics and carbon nanotubes.