Program Announcement/Technical Program
Call for Papers
Registration
author's instruction for Oral presentations
author's instruction for poster presentations
Stanford Sierra Conference Center
aka Wafer Level Reliability Workshop
Keynote
Tutorials: Drew Turner, IBM, has organized an excellent tutorial program.  A partial list ...
Managment Committee

IRW 2008 · October 12-16, 2008***
Stanford Sierra Camp, Fallen Leaf Lake, California

***note the workshop start date has moved to Sunday

    The final report of the 2008 International Integrated Reliability Workshop represents the final product of the many authors and volunteers who made this year’s meeting a great success. Since it began in 1982 as the Wafer Level Reliability Workshop, the meeting has maintained a character very different from most other scientific and technical meetings. Attendees are encouraged and expected to participate actively in every aspect of the Workshop, to share their own results and insights, to question speakers, to take part in the discussion groups and special interest groups. Since it began, the Workshop has maintained an atmosphere which fosters close interaction among attendees in a setting of great natural beauty with minimal distractions.

    We were very fortunate this year to have Dakshi Dakshinamoorthy, vice president of Freescale Semiconductor for reliability and quality assurance, as our keynote speaker. His excellent presentation, “Quality and Reliability Challenges for Growing Markets,” helped set the tone for a very productive meeting.

    We began a new meeting format this year, starting on Sunday evening with a special tutorial by prof. Subhash Mitra of Stanford University. Prof. Mitra spoke about circuit failure prediction for robust system design in scaled CMOS. In the new format we were able to devote a full day to a single track of five more outstanding tutorials, presented by world class experts.

    Our contributed technical program of twenty five oral presentations, nine refereed poster presentations, and several walk in posters, dealt broadly with some of the most important topics in reliability today: NBTI, high-k MOS problems, reliability in compound semiconductor devices, fWLR, back- end reliability issues, reliability in sensors, and memories.

    As is always the case, the evenings were fully occupied by after dinner discussion groups and poster sessions. Wednesday evening was enlivened by Dr. Yuan Chen of Cal Tech’s Jet Propulsion Laboratory. Yuan presented a very entertaining talk about space exploration and mission assurance.

    This year’s workshop could not have taken place without the hard work of many volunteers on the technical program committee and the management committee. It was great to work with all of you!

    Next year’s workshop will be held from October 18 to 22, 2009. Additional details about next year’s meeting can be found in the call for papers. Hope to see you at next year’s workshop.

                                    Patrick M. Lenahan
                                    General Chair , IIRW 2008