Fallen Leaf Lake

Reliability Experts Forum

The International Integrated Reliability workshop (IIRW 2018), the IEEE Electron Device Society (EDS) and the Reliability Society (RS) are pleased to announce the inaugural “Reliability Experts Forum” which will be held on Tuesday, October 9th as part of the IIRW 2018 technical program, which is taking place at the Stanford Sierra Conference center, South Lake Tahoe, USA, from October 7th to 11th.


The 1-day event aims to assemble the top reliability experts to discuss the current understanding and the challenges facing the three main transistor reliability mechanisms -- TDDB, BTI and Hot Carrier degradation. The three panel discussions will focus on device physics and the reliability models associated with each mechanism. Each session will be ran by a moderator, and animated by multiple panelists.   


More than forty world-renown reliability experts are invited to share their views and enrich the discussion. 



BTI panel

Moderator: Jason Campbell (NIST)
Panelists: Tibor Grasser (University of Vienna), Souvik Mahapatra (IIT Bombay), Andreas Kerber, James Stathis (IBM), Ben Kaczer (IMEC), Gennadi Bersurker (The Aerospace Corporation) 


Hot Carrier panel

Moderator: Stanislas Tyaginov (imec)
Panelists: Stephen Ramey (Intel), Stewart Rauch (Globalfoundries), Miaomiao Wang (IBM), Jen Hao Lee (TSMC), Dimitris Ioannou (Globalfoundries)


TDDB panel

Moderator: Luca Larcher (Univerisity of Modena)
Panelists: Ernest Wu (IBM), Joe McPherson (McPherson Reliabiliy Consulting), Tanya Nigam (Globalfoundries), Kin Leong Pey (SUTD), Chetan Prasad (Intel), Alex Shluger (UCL)  



Organizing committee



IIRW 2018 General ChairLuca LarcherU. Modena and Reggio Emilia
IIRW 2018 Technical Program ChairZakariae ChbiliGLOBALFOUNDRIES
EDS Device Reliability Physics Committee ChairSouvik MahapatraIIT Bombay
EDS Device Reliability Physics Committee memberStephen RameyIntel




For further information please contact the Technical Program Chair:

Zakariae Chbili, Globalfoundries
Email: iirw2018@gmail.com