Program
Sunday Night Tutorial
Resilient and Cyber Secure Public Utility Infrastructure
Mohammed Ben-Idris
University of Nevada
Keynote Talk
JWST System Architecture and Science Performance: a function of parts selection, qualification, protection and performance
Julie Van Campen
NASA
Tutorial Program
Tutorial#1: Memory Technology: Reliability Challenges and Future Perspectives
Attilio Belmonte
imec
Tutorial#2: Reliability of Energy-Efficient Phase Change Memory Based on Novel Superlattices and Nanocomposites
Asir Intisar Khan
Stanford University
Tutorial#3: Brief Introduction to Device and Circuit Reliability
Ben Kaczer
imec
Tutorial#4: 22FDX® RF/mm Wave Reliability
Mahesh Siddabathula
GlobalFoundries
Invited Speakers
Progress in GaN Power Device Technology and Reliability
Davide Bisi
Transphorm Inc.
Reconciliation of Power Law and E Dependencies of TDDB: Towards a Universal Model of Dielectric Breakdown
Andrea Padovani
University of Modena and Reggio Emilia
Circuit-Level Insights of Soft Errors and Aging Degradations
Kazutoshi Kobayashi
Kyoto Institute of Technology
From Device Reliability to Circuit Qualification: an Overview and some Challenges
Florian Cacho
ST Microelectronics
On Ageing of On-Chip Voltage Regulators
Saibal Mukhopadhyay
Georgia Institute of Technology
Plasma-Induced Damage: Modeling and Characterization
Koji Eriguchi
Kyoto University
Reliability Challenges of SiC Power MOSFETs
Michael Waltl
Technische Universität Wien
Discussion Groups
DG#1: In-Memory Computing
Chair: Francesco Maria Puglisi, University of Modena and Reggio Emilia
DG#2: Circuit Reliability
Chair: Ben Kaczer, imec
DG#3: Plasma-Induced Damage
Chair: Andreas Martin, Infineon
Reliability Experts Forum
Panel#1: Electrostatic Discharge/Latch-Up
Moderator: Suresh Uppal, Rivos Inc.
Ann Concannon
Texas Instruments
Vadim Kushner
Skywater Technologies
Julie Van Campen
NASA
Panel#2: Packaging Reliability
Moderator: Suresh Uppal, Rivos Inc.
Subramanian Lalgudi
Siemens Digital Industry Software
Jim Faull
Micron
Jian Li