8-12 October 2023

Stanford Sierra Conference Center

Fallen Leaf Lake, CA, USA

Welcome to IIRW

The IEEE International Integrated Reliability Workshop (IIRW) originated from the Wafer Level Reliability Workshop in 1982. The IIRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems.

Tutorials, paper presentations, poster sessions, moderated discussion groups, special interest groups, and the informal format of the technical program provide a unique environment for understanding, developing, and sharing reliability technology and test methodologies for present and future semiconductor applications as well as ample opportunity for open discussions and interactions with colleagues.

IIRW 2022 Best student paper

"Exploring Process-Voltage-Temperature Variations Impact on 4T1R Multiplexers for Energy-aware Resistive RAM-based FPGAs"  by Tommaso Rizzi, IHP Microelectronics GmbH 

Important Dates

Regular Abstract Deadline: July 16, 2023

Author Notification: August 13, 2023

Late News Deadline: September 10, 2023


General Chair: Francesco Maria Puglisi gc.iirw@gmail.com

Technical Program Chair: Charles LaRow  tpc.iirw@gmail.com

Call For Papers



IIRW 2023 welcomes abstracts on, but not limited to, these topics: