11-14 October 2021
Stanford Sierra Conference Center
Fallen Leaf Lake, CA, USA
Welcome to IIRW
The IEEE International Integrated Reliability Workshop (IIRW) originated from the Wafer Level Reliability Workshop in 1982. The IIRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems.
Tutorials, paper presentations, poster sessions, moderated discussion groups, special interest groups, and the informal format of the technical program provide a unique environment for understanding, developing, and sharing reliability technology and test methodologies for present and future semiconductor applications as well as ample opportunity for open discussions and interactions with colleagues.
Depending on the COVID-19 pandemic scenario IIRW 2021 could be virtual.
IIRW 2020 Best student paper
"Circuit Reliability Analysis of In-Memory Inference in Binarized Neural Networks" by Tommaso Zanotti, Francesco Maria Puglisi and Paolo Pavan
Scope
The IIRW technical program and management committee invites abstracts related to the many areas of semiconductor reliability, such as:
FEOL/MOL/BEOL dielectrics (high-k, SiO 2 , SiON, low-k)
FET, FinFET, SOI, III-V, SiGe reliability (HC, BTI, TDDB, etc.)
Conventional and emerging memories (Flash, RRAM, etc.)
Neuromorphic devices and circuits reliability
Emerging technologies and devices (2D materials, IGZO, etc.)
Power, wide-bandgap (SiC, GaN, etc.) devices reliability
RF and mm/sub-mm Wave devices reliability
Modeling and simulation of reliability, including self-heating
Failure analysis and Advanced packaging reliability
Impact of devices degradation on circuit reliability
Design in reliability (products, circuits, systems, processes)
Advanced automotive circuits, systems, products reliability
Customer/manufacturer product reliability requirements
Wafer-level reliability tests for monitoring and qualification
Important Dates
Regular Abstract Deadline: July 9, 2021
Late News Deadline: September 10, 2021
Contacts
General Chair: Matthew Ring gc.iirw@gmail.com
Technical Program Chair: Matthew Hogan tpc.iirw@gmail.com