Reliability Experts Forum

Peter Moens

Wide Bandgap Reliability for Power and RF Applications Panel

Peter Moens received a Master in nuclear physics and a Ph.D. in solid state physics from the University of Gent, Belgium, in 1990 and 1993 respectively. At onsemi is working on SiC MOSFETs. He is/was a member of the technical program committees of IEDM, ISPSD, IRPS, CSMANTECH, ICSCRM, IRW, EDTM, ESSDERC and ESREF. He was the General chair of ISPSD 2012. He authored and co-authored over 200 publications in peer reviewed journals or conferences, 20 invited papers, and is the recipient of 6 best paper awards (including 2 ISPSD best paper awards as first author). He presented tutorials at IRPS, ISPSD and EDTM. He is an inductee of the ISPSD International Hall of Fame. He holds 62 US patents.

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