Biography: Jeffrey Hicks is an Intel Senior Fellow and Director of Technology Reliability Pathfinding. He oversees Intel’s reliability strategy across a range of disciplines, leading programs and functions to address complex inter-disciplinary challenges spanning silicon technology, packaging, manufacturing, and product design and architecture. He is dedicated to making reliability a driving force in the advance of digital technologies through innovation within Intel and the broader ecosystem in collaboration with customers and other external partners. Mr. Hicks has worked at Intel since 1980 across a wide range of Quality and Reliability functions. He received a B.S. degree in applied physics from the California Institute of Technology, has published over two dozen technical papers and holds several patents.