8-12 October 2023
Stanford Sierra Conference Center
Fallen Leaf Lake, CA, USA
REGISTRATION IS NOW OPEN!
Welcome to IIRW
The IEEE International Integrated Reliability Workshop (IIRW) originated from the Wafer Level Reliability Workshop in 1982. The IIRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems.
Reliability Experts Forum panels announced:
Vmax and technology scaling
Hot Carrier Degradation
Panelists recruited among top leaders in the industry and academia will be announced soon in new dedicated page on this website
Papers submission site will open soon
Registration is now open!
Regular submission closed!
Late news submission is closed!
Call For Papers
Emerging technologies and devices (2D materials, IGZO, etc.)